wat

芯片测试:WAT、CP、FT

WAT(Wafer Acceptance Test)测试,也叫PCM(Process Control Monitoring),对Wafer 划片槽(Scribe Line)测试键(Test Key)的测试,通过电性参数来监控各步工艺是否正常和稳定.

芯片 cp chip wafer wat 2025-10-31 12:39  2